Russian Mineralogical Society
200th Anniversary Meeting of the Russian Mineralogical Society
Ion implantation of minerals and their synthetic analogues: modern condition and prospects

RMS-DPI code:  2017-1-218-0
Scientific session:  5. New analytical techniques in studies of minerals, rocks and ores.
Author listing:  Nikolaev A.G., Lopatin O.N., Khaibullin R.I., Nuzhdin V.I., Mukhametshin A.V.
Principal author:  Nikolaev Anatolij Germanovich
Language:  Russian
Abstract - Summary 
(short description):
In this paper, crystal-chemical features of mineral substances subjected to ion-beam exposure by the high-dose ion implantation method are analyzed and the mechanisms of localization of implanted ions of chemical elements in the space of native, oxide and silicate crystalline structures are considered. The prospect of ion-beam modification of physical properties of minerals is shown, as well as the use of this technique in the field of refinement of precious stones.
RMS-DPI code:  2017-1-218-0
Pages:  395-397
File of proceedings 
 96 K
Status:  printed
Accepted:  16/09/2017
Published on-line:  07/12/2017
Permanent address of publication:
Contact author(s):  Nikolaev, Anatolij Germanovich

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printed on 08/07/2020