Many mineralogical phases, as well as new developed synthetic compounds, occur only in form of nano-crystalline materials. The structure characterization of these phases results often impossible with conventional X-ray techniques. Conversely, an electron beam inside a TEM can be focused on a spot of few nanometres, allowing single nano-crystal analysis. In order to acquire more complete data set and reduce dynamical effects and beam damage, a new technique for automated collection of nano electron diffraction data from non-oriented zones was developed: Automated Diffraction electron Tomography (ADT). The method delivers straight “ab initio” structure solution for simple to very complicate minerals.